Thin Film Analysis by X-Ray Scattering
Book Details
Format
Hardback or Cased Book
ISBN-10
3527310525
ISBN-13
9783527310524
Publisher
Wiley-VCH Verlag GmbH
Imprint
Blackwell Verlag GmbH
Country of Manufacture
DE
Country of Publication
GB
Publication Date
Nov 15th, 2005
Print length
378 Pages
Weight
766 grams
Dimensions
24.80 x 17.00 x 2.60 cms
Product Classification:
Materials / States of matter
AI Summary
Ksh 27,700.00
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With contributions by Paul F. Fewster and Christoph Genzel While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of thin films.
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