Thermal Reliability of Power Semiconductor Device in the Renewable Energy System

2022 ed.

by Cheng Qian , Gaoxian Li , Jun Zhang , Rui Du , Xiong Du , Yaoyi Yu

Book Details

Format Hardback or Cased Book

Book Series CPSS Power Electronics Series

ISBN-10 9811931313

ISBN-13 9789811931314

Edition 2022 ed.

Publisher Springer Verlag, Singapore

Imprint Springer Verlag, Singapore

Country of Manufacture GB

Country of Publication GB

Publication Date Jul 9th, 2022

Print length 172 Pages

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Ksh 23,400.00

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This book focuses on the thermal reliability of power semiconductor device by looking at the failure mechanism, thermal parameters monitoring, junction temperature estimation, lifetime evaluation, and thermal management. Theoretical analysis and experimental tests are presented to explain existing reliability improvement techniques. This book is a valuable reference for the students and researchers who pay attention to the thermal reliability design of power semiconductor device.

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