Test Generation of Crosstalk Delay Faults in VLSI Circuits
Softcover Reprint of the Original 1st 2019 ed.
Book Details
Format
Paperback / Softback
ISBN-10
9811347840
ISBN-13
9789811347849
Edition
Softcover Reprint of the Original 1st 2019 ed.
Publisher
Springer Verlag, Singapore
Imprint
Springer Verlag, Singapore
Country of Manufacture
GB
Country of Publication
GB
Publication Date
Dec 21st, 2018
Print length
156 Pages
Product Classification:
Circuits & componentsComputer hardwareComputer architecture & logic design
AI Summary
Ksh 21,600.00
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The book begins with a focus on currently available crosstalk delay models, test generation algorithms for delay faults and crosstalk delay faults, before moving on to deterministic algorithms and simulation-based algorithms used to test crosstalk delay faults.
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