Scanning Electron Microscopy and X-Ray Microanalysis : Third Edition

Third Edition 2003

by Charles E. Lyman , Dale E. Newbury , David C. Joy , Eric Lifshin , J.R. Michael , Joseph Goldstein , Linda Sawyer , Patrick Echlin

Book Details

Format Hardback or Cased Book

ISBN-10 0306472929

ISBN-13 9780306472923

Edition Third Edition 2003

Publisher Springer Science+Business Media

Imprint Kluwer Academic/Plenum Publishers

Country of Manufacture US

Country of Publication GB

Publication Date Jan 31st, 2003

Print length 689 Pages

Weight 1,684 grams

Dimensions 25.50 x 17.80 x 3.80 cms

Product Classification: Microscopy Materials science

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In the decade since the publication of the second edition of Scanning Electron Microscopy and X-Ray Microanalysis, there has been a great expansion in the capabilities of the basic scanning electron microscope (SEM) and the x-ray spectrometers.

This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed.

Get Scanning Electron Microscopy and X-Ray Microanalysis by at the best price and quality guaranteed only at Werezi Africa's largest book ecommerce store. The book was published by Springer Science+Business Media and it has pages.