Reliability Wearout Mechanisms in Advanced CMOS Technologies
Book Details
Format
Hardback or Cased Book
Book Series
IEEE Press Series on Microelectronic Systems
ISBN-10
0471731722
ISBN-13
9780471731726
Publisher
John Wiley & Sons Inc
Imprint
Wiley-IEEE Press
Country of Manufacture
US
Country of Publication
GB
Publication Date
Sep 4th, 2009
Print length
640 Pages
Weight
993 grams
Dimensions
24.30 x 16.40 x 3.40 cms
Product Classification:
Circuits & componentsComputer science
AI Summary
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This invaluable resource tells the complete story of failure mechanisms from basic concepts to the tools necessary to conduct reliability tests and analyze the results. Both a text and a reference work for this important area of semiconductor technology, it assumes no reliability education or experience.
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