Reliability Wearout Mechanisms in Advanced CMOS Technologies

by Alvin W. Strong , Ernest Y. Wu , Giuseppe La Rosa , Jordi Sune , Rolf-Peter Vollertsen , Stewart E. Rauch , Timothy D. Sullivan

Book Details

Format Hardback or Cased Book

Book Series IEEE Press Series on Microelectronic Systems

ISBN-10 0471731722

ISBN-13 9780471731726

Publisher John Wiley & Sons Inc

Imprint Wiley-IEEE Press

Country of Manufacture US

Country of Publication GB

Publication Date Sep 4th, 2009

Print length 640 Pages

Weight 993 grams

Dimensions 24.30 x 16.40 x 3.40 cms

Product Classification: Circuits & components Computer science

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This invaluable resource tells the complete story of failure mechanisms from basic concepts to the tools necessary to conduct reliability tests and analyze the results. Both a text and a reference work for this important area of semiconductor technology, it assumes no reliability education or experience.

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