Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices
Book Details
Format
Hardback or Cased Book
Book Series
Selected Topics in Electronics and Systems
ISBN-10
9812389407
ISBN-13
9789812389404
Publisher
World Scientific Publishing Co Pte Ltd
Imprint
World Scientific Publishing Co Pte Ltd
Country of Manufacture
GB
Country of Publication
GB
Publication Date
Aug 3rd, 2004
Print length
348 Pages
Product Classification:
Circuits & components
AI Summary
Ksh 24,100.00
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This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide-semiconductor (MOS), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level.
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