Positron Annihilation in Semiconductors : Defect Studies

Softcover reprint of hardcover 1st ed. 1999

by Hartmut S. Leipner , Reinhard Krause-Rehberg

Book Details

Format Paperback / Softback

Book Series Springer Series in Solid-State Sciences

ISBN-10 3642084036

ISBN-13 9783642084034

Edition Softcover reprint of hardcover 1st ed. 1999

Publisher Springer-Verlag Berlin and Heidelberg GmbH & Co. KG

Imprint Springer-Verlag Berlin and Heidelberg GmbH & Co. K

Country of Manufacture DE

Country of Publication GB

Publication Date Dec 1st, 2010

Print length 383 Pages

Weight 626 grams

Dimensions 15.60 x 23.20 x 4.70 cms

Product Classification: Condensed matter physics (liquid state & solid state physics)Spectrum analysis, spectrochemistry, mass spectrometry Testing of materials Electronic devices & materials

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The subject of this book is the investigation of lattice imperfections in semiconductors by means of positron annihilation. The sensitivity range of positron annihilation with respect to the detection of these defects is compared to that of other defect-sensitive methods.

This comprehensive book reports on recent investigations of lattice imperfections in semiconductors by means of positron annihilation. It reviews positron techniques, and describes the application of these techniques to various kinds of defects, such as vacancies, impurity vacancy complexes and dislocations.

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