Photo-induced Defects in Semiconductors

by David Redfield , Richard H. Bube

Book Details

Format Paperback / Softback

Book Series Cambridge Studies in Semiconductor Physics and Microelectronic Engineering

ISBN-10 0521024455

ISBN-13 9780521024457

Publisher Cambridge University Press

Imprint Cambridge University Press

Country of Manufacture GB

Country of Publication GB

Publication Date Mar 9th, 2006

Print length 232 Pages

Weight 350 grams

Dimensions 22.90 x 15.20 x 1.40 cms

Product Classification: Electricity, electromagnetism & magnetism Semi-conductors & super-conductors

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This is the first book to give a complete overview of the properties of deep-level, localized defects in semiconductors. These metastable defects exhibit complex interactions with the surrounding material, and can significantly affect the performance and stability of certain semiconductor devices.

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