Noise Coupling in System-on-Chip

The book presents information written by international experts in the field of Systems on Chip (SoC) Coupling, including substrate and interconnect magnetic crosstalk, 2D and 3D circuits noise coupling, and TSV and simulation. It enables the reader to analyze crosstalk noise propagating through the parasitics interconnect and package and the PCB.

Noise Coupling is the root-cause of the majority of Systems on Chip (SoC) product fails. The book discusses a breakthrough substrate coupling analysis flow and modelling toolset, addressing the needs of the design community. The flow provides capability to analyze noise components, propagating through the substrate, the parasitic interconnects and the package. Using this book, the reader can analyze and avoid complex noise coupling that degrades RF and mixed signal design performance, while reducing the need for conservative design practices. With chapters written by leading international experts in the field, novel methodologies are provided to identify noise coupling in silicon. It additionally features case studies that can be found in any modern CMOS SoC product for mobile communications, automotive applications and readout front ends.

Get Noise Coupling in System-on-Chip by at the best price and quality guaranteed only at Werezi Africa's largest book ecommerce store. The book was published by Taylor & Francis Inc and it has pages.