High Resolution X-Ray Diffractometry And Topography

by Brian K. Tanner , D.K. Bowen

Book Details

Format Hardback or Cased Book

ISBN-10 0850667585

ISBN-13 9780850667585

Publisher Taylor & Francis Ltd

Imprint Taylor & Francis Ltd

Country of Manufacture GB

Country of Publication GB

Publication Date Feb 5th, 1998

Print length 262 Pages

Weight 656 grams

Dimensions 26.30 x 17.80 x 2.00 cms

Product Classification: Maths for scientists Maths for engineers

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Ksh 36,000.00

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The application of electronic materials has created a demand for reliable techniques for examining these materials. This book looks at the area of x-ray diffraction and the modern techniques available for deployment in research. It provides the background for applying these techniques.

The study and application of electronic materials has created an increasing demand for sophisticated and reliable techniques for examining and characterizing these materials. This comprehensive book looks at the area of x-ray diffraction and the modern techniques available for deployment in research, development, and production. It provides the theoretical and practical background for applying these techniques in scientific and industrial materials characterization. The main aim of the book is to map the theoretical and practical background necessary to the study of single crystal materials by means of high-resolution x-ray diffraction and topography. It combines mathematical formalisms with graphical explanations and hands-on practical advice for interpreting data.

Get High Resolution X-Ray Diffractometry And Topography by at the best price and quality guaranteed only at Werezi Africa's largest book ecommerce store. The book was published by Taylor & Francis Ltd and it has pages.