Cluster Secondary Ion Mass Spectrometry : Principles and Applications
Book Details
Format
Hardback or Cased Book
Book Series
Wiley Series on Mass Spectrometry
ISBN-10
0470886056
ISBN-13
9780470886052
Publisher
John Wiley & Sons Inc
Imprint
John Wiley & Sons Inc
Country of Manufacture
SG
Country of Publication
GB
Publication Date
Jun 28th, 2013
Print length
368 Pages
Weight
762 grams
Dimensions
16.50 x 24.30 x 2.10 cms
Product Classification:
Spectrum analysis, spectrochemistry, mass spectrometry
AI Summary
Ksh 19,250.00
Werezi Extended Catalogue
0 in stock
Delivery Location
Delivery fee: Select location
Secure
Quality
Fast
This book describes the importance of the emerging technique Cluster Secondary Ion Mass Spectrometry (SIMS), which is used for the analysis of a range of solid materials, including everything from organic and polymeric materials, to cells and semiconductors.
Get Cluster Secondary Ion Mass Spectrometry by at the best price and quality guaranteed only at Werezi Africa's largest book ecommerce store. The book was published by John Wiley & Sons Inc and it has pages.
Discover books you might love based on this title.
More in This Genre
Analytical Techniques in Biochemistry
Ksh 7,200.00
Modern Vibrational Spectroscopy and Micro-Spectroscopy
Ksh 20,500.00
Guidelines for Achieving High Accuracy in Isotope Dilution Mass Spectrometry (IDMS)
Ksh 9,000.00
Symmetry and Spectroscopy
Ksh 5,300.00
Organic Electronic Spectral Data, Volume 25, 1983
Ksh 86,750.00
Annual Reports on NMR Spectroscopy
Ksh 31,850.00
