Characterization of High Tc Materials and Devices by Electron Microscopy
Book Details
Format
Hardback or Cased Book
ISBN-10
052155490X
ISBN-13
9780521554909
Publisher
Cambridge University Press
Imprint
Cambridge University Press
Country of Manufacture
GB
Country of Publication
GB
Publication Date
Jul 6th, 2000
Print length
406 Pages
Weight
1,125 grams
Dimensions
24.40 x 17.00 x 2.40 cms
AI Summary
Ksh 25,550.00
Manufactured on Demand
0 in stock
Delivery Location
Delivery fee: Select location
Secure
Quality
Fast
This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, it provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications.
Get Characterization of High Tc Materials and Devices by Electron Microscopy by at the best price and quality guaranteed only at Werezi Africa's largest book ecommerce store. The book was published by Cambridge University Press and it has pages.
Discover books you might love based on this title.
More in This Genre
Laser Control of Atoms and Molecules
Ksh 15,000.00
Drop Dynamics and Dropwise Condensation on Textured Surfaces
Ksh 16,200.00
TMS 2019 148th Annual Meeting & Exhibition Supplemental Proceedings
Ksh 54,000.00
Polymers for Biomedicine
Ksh 39,050.00
Advances in Nanomaterials and Nanostructures
Ksh 21,950.00
Technical Proceedings of the 2005 NSTI Nanotechnology Conference and Trade Show, Volume 3
Ksh 13,800.00