Characterization of High Tc Materials and Devices by Electron Microscopy
Book Details
Format
Paperback / Softback
ISBN-10
0521031702
ISBN-13
9780521031707
Publisher
Cambridge University Press
Imprint
Cambridge University Press
Country of Manufacture
GB
Country of Publication
GB
Publication Date
Nov 23rd, 2006
Print length
408 Pages
Weight
669 grams
Dimensions
24.30 x 16.80 x 2.10 cms
Product Classification:
Condensed matter physics (liquid state & solid state physics)Materials science
AI Summary
Ksh 8,600.00
Manufactured on Demand
0 in stock
Delivery Location
Delivery fee: Select location
Secure
Quality
Fast
This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, it provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications.
Get Characterization of High Tc Materials and Devices by Electron Microscopy by at the best price and quality guaranteed only at Werezi Africa's largest book ecommerce store. The book was published by Cambridge University Press and it has pages.
Discover books you might love based on this title.
More in This Genre
Encyclopedia Of Two-phase Heat Transfer And Flow Iv: Modeling Methodologies, Boiling Of Co2, And Micro-two-phase Cooling (A 4-volume Set)
Ksh 232,200.00
Advances in Mechanical Engineering and Material Science
Ksh 36,000.00
Design of Materials and Technologies for Environmental Remediation
Ksh 54,000.00
Simple Views On Condensed Matter (Third Edition)
Ksh 32,400.00
Quantum Atom Optics
Ksh 9,150.00
Benjamin Lax - Interviews on a Life in Physics at MIT
Ksh 34,200.00
