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Active Probe Atomic Force Microscopy
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Active Probe Atomic Force Microscopy : A Practical Guide on Precision Instrumentation

2024 ed.

by Fangzhou Xia , Ivo W. Rangelow , Kamal Youcef-Toumi

Book Details

Format Hardback or Cased Book
ISBN-10 3031442326
ISBN-13 9783031442322
Edition 2024 ed.
Publisher Springer International Publishing AG
Imprint Springer International Publishing AG
Country of Manufacture GB
Country of Publication GB
Publication Date Feb 7th, 2024
Print length 366 Pages
Product Classification: MicroscopySpectrum analysis, spectrochemistry, mass spectrometry

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Ksh 14,400.00
Werezi Extended Catalogue 0 in stock

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From a perspective of precision instrumentation, this book provides a guided tour to readers on exploring the inner workings of atomic force microscopy (AFM).

Get Active Probe Atomic Force Microscopy by at the best price and quality guaranteed only at Werezi Africa's largest book ecommerce store. The book was published by Springer International Publishing AG and it has pages.

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